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Bench Probing Plan

The LSI board (PCB 20918) is exposed with the top cover removed, its 8–9 test points accessible without tilting any keyboards. Before Phase 1 bench testing (CapSense viability), a systematic probing session characterizes the organ’s existing signals — frequencies, voltage levels, impedances, and timing. These measurements establish the baseline that every subsequent design decision builds on.

ToolSpecsRole
20 MHz oscilloscopeAnalog bandwidth 20 MHzVoltage measurement, waveform shape, analog signals
8-ch USB logic analyzerSaleae-compatible, 24 MHz sampling, 5.25V max inputDigital timing, frequency measurement, multi-channel capture
NanoVNA-HVector network analyzer, USB-controlled via mcnanovnaBus bar impedance, filter network characterization, S-parameters
sigrok + PulseViewOpen source, LinuxLogic analyzer software with frequency counters and protocol decoders

The confirmed 142164X (AY-3-0214 family, 16-pin DIP, see IC identification) uses a crystal-controlled master clock. From the MK50240 datasheet:

Master clock: 2.000240 MHz

This is the only signal near the logic analyzer’s Nyquist limit. At 24 MHz sampling, each clock cycle gets roughly 12 samples — adequate for frequency measurement but not for clean waveform reconstruction. The 20 MHz oscilloscope will show it, but attenuated (~−3 dB at its bandwidth limit). Use a 10× probe to minimize loading.

Every other signal in the organ is orders of magnitude lower in frequency and will be massively oversampled.

The MK50240 divides the 2.000240 MHz master clock by integer divisors to produce the top octave — the 13 chromatic notes from which all lower octaves are derived by binary division. These are the frequencies the logic analyzer should confirm:

PinNoteDivisorFrequency (Hz)Samples/Cycle at 24 MHz
15C (high)2398,3692,868
14B2537,9063,034
13A♯2687,4633,216
12A2847,0433,409
11G♯3016,6453,613
10G3196,2713,830
9F♯3385,9184,055
8F3585,5884,295
7E3795,2784,548
6D♯4024,9764,823
5D4264,6955,112
4C♯4514,4355,413
16C (low)4784,1855,735

All TOS outputs fall between 4–8.4 kHz — massively oversampled by the 24 MHz logic analyzer. Frequency measurement will be extremely accurate.

Each divider stage halves the frequency. The logic analyzer covers every octave with increasing ease as frequency drops:

OctaveFrequency RangeExample (A)Logic Analyzer Coverage
TOS output (top)4,185–8,369 Hz7,043 HzExcellent
÷22,093–4,185 Hz3,520 HzExcellent
÷41,047–2,093 Hz1,760 HzExcellent
÷8523–1,047 Hz880 HzExcellent
÷16262–523 Hz440 Hz (A4)Excellent
÷32131–262 Hz220 HzExcellent
÷64 (pedals)65–131 Hz110 HzExcellent
÷128 (lowest pedal)33–65 Hz55 HzExcellent

Session 1: Oscilloscope Only — Voltage Characterization

Section titled “Session 1: Oscilloscope Only — Voltage Characterization”

Safety-critical. Organ powered on, 10× probe, no logic analyzer connected.

  1. Measure voltage on each of the 8–9 test points on PCB 20918

    Document DC level, AC amplitude, and waveform shape for each. These test points were put there by Wurlitzer’s engineers — they almost certainly correspond to key signal nodes in the divider-keyer chain.

  2. Measure voltage on a key contact bus bar

    Press and hold a key while probing the corresponding bus bar. Confirm the 0–12V swing documented in the signal architecture. Record the exact high and low levels — the divider resistor values depend on this.

  3. Measure TOS output voltage

    If accessible from the test points, verify the TOS output amplitude. The MK50240 datasheet specifies output levels relative to VSS, which may be 15V.

  4. Measure master clock amplitude at the TOS clock input pin

    Use 10× probe to minimize loading on the 2 MHz crystal oscillator circuit. Record amplitude and waveform shape (sine vs. square — crystal oscillators in this era could go either way).

  5. Document the safe/unsafe signal map

    Classify each probed point: ≤ 5V (safe for logic analyzer direct connection) or > 5V (requires voltage divider). This map governs every subsequent session.

Session 2: Logic Analyzer — Digital Signal Characterization

Section titled “Session 2: Logic Analyzer — Digital Signal Characterization”

Only after Session 1 confirms voltage levels.

  1. Connect to test points confirmed ≤ 5V (or through voltage dividers for higher-voltage signals)

  2. Capture TOS outputs — verify all 13 notes present at expected frequencies

    Use PulseView’s frequency counter decoder on each channel. Compare measured frequencies against the table above. Any deviation from the calculated values indicates a master clock frequency error or a different TOS variant than expected.

  3. Capture divider chain outputs for one note — verify octave relationships

    Each stage should produce exactly half the frequency of the stage above. Deviations indicate a faulty divider stage.

  4. Capture key contact state changes — press/release timing, debounce characteristics

    This feeds directly into the debounce measurement protocol below.

  5. Capture multiple keys simultaneously — verify no crosstalk

    Press keys on adjacent bus bars and verify clean, independent transitions with no coupling between channels.

Session 3: Oscilloscope — Analog Signals

Section titled “Session 3: Oscilloscope — Analog Signals”
  1. Leslie reed switch coil drive voltage

    Measure in both Slow and Fast positions. This voltage determines the relay or optocoupler specification for the MIDI Leslie control interface.

  2. Expression pedal analog signal

    Sweep the pedal through its full range. Record voltage endpoints and linearity. Check the lateral slide axis separately.

  3. Voicing filter outputs

    Capture waveform shapes for flute, reed, and string voices on the oscilloscope. These are the raw filter responses that transform square waves into the organ’s characteristic timbres — worth documenting even though they aren’t directly relevant to the MIDI conversion.

  4. Power supply ripple

    Measure ripple on the main DC rails under load (organ playing). This establishes a baseline before the electrolytic recap.

Session 4: NanoVNA — Impedance Characterization

Section titled “Session 4: NanoVNA — Impedance Characterization”

With the organ powered off, the NanoVNA characterizes passive network properties that the oscilloscope and logic analyzer can’t measure directly.

  1. Bus bar impedance

    Measure the impedance looking into a bus bar with all keys released (open) and with one key pressed (loaded). The impedance at audio frequencies determines the AC coupling pickup design — specifically, how much signal a capacitively-coupled sensor can extract without loading the bus bar enough to affect the organ’s voicing.

  2. Voicing filter network response

    Sweep the filter boards across the audio band (20 Hz – 20 kHz). The S₂₁ (transmission) measurement shows the filter’s frequency response directly, confirming which harmonics each voice tab passes or attenuates. Compare flute (mostly fundamental) vs. string (rich harmonics) vs. reed (nasal bandpass).

  3. Expression pedal potentiometer characterization

    Measure resistance and impedance across the pedal’s travel. If the pot is logarithmic vs. linear, the VNA sweep will show it clearly in the impedance-vs-position curve.

  4. Key contact impedance

    With a key pressed, measure the contact impedance at the bus bar. Low contact impedance confirms healthy contacts; elevated or inconsistent impedance across keys may indicate oxidized contacts requiring cleaning.

Install on Arch Linux:

Terminal window
sudo pacman -S sigrok-cli pulseview

Connect the Saleae-compatible analyzer via USB. Sampling rate recommendations:

MeasurementSampling RateRationale
TOS frequency measurement12 MHz6 MHz would suffice; lower rate = longer capture buffer
Divider chain verification4 MHzSignals are all < 10 kHz
Key debounce timing24 MHzNeed µs-scale resolution to see contact bounce

Use the frequency counter decoder on each channel for automated frequency readout. Export captures as .sr files for the project archive.

Patent US3330916 describes beryllium-copper + silver-platinum contacts in Wurlitzer organs of this era. Moro’s thesis measured approximately 200 µs oscillation period and 5 ms total settling on Hammond contacts — but the 555’s contacts are a different metallurgy, different geometry, and different spring tension. This measurement establishes the actual debounce timing for the shift register firmware.

Method:

Logic analyzer on a key contact bus bar (through voltage divider if needed), 24 MHz sampling, trigger on falling edge, 10 ms capture window.

  1. Press the key slowly, then quickly. Repeat 20 times for statistical significance.

  2. Record for each keystroke:

    • First contact to stable closure (total bounce duration)
    • Oscillation period during bounce
    • Any asymmetry between make and break
    • Variation across slow vs. fast keystrokes
  3. Repeat on 3–4 keys at different positions across the keyboard (low end, middle, high end) to check for position-dependent variation.

The resulting bounce duration directly determines the debounce delay constant in the ESP32 firmware (Phase 2 of the implementation roadmap). Moro’s 5 ms settling time is the starting assumption — the bench measurement either confirms it or gives us the real number.

For each measurement session, document:

  • Date, ambient temperature (capacitor ESR and contact resistance both vary with temperature)
  • Which test point / pin / bus bar was probed
  • Oscilloscope or logic analyzer settings (timebase, voltage scale, sampling rate)
  • Screenshot or capture file (.sr for PulseView, .s2p for NanoVNA)
  • Measured value vs. expected value from the tables above

Store all capture files in the project repository under captures/ with filenames that encode the session, date, and signal measured.